finelybook
Rad-hard Analog ICs (River Publishers Series in Electronic Materials, Circuits and Devices)
Author(s): Umberto Gatti (Author), Cristiano Calligaro (Author)
- Publisher Finelybook 出版社: River Publishers
- Publication Date 出版日期: September 1, 2026
- Edition 版本: 1st
- Language 语言: English
- Print length 页数: 284 pages
- ASIN: B0H985TZSK
- ISBN-13: 9788743813293
- Publisher Finelybook 出版社: River Publishers
- Publication Date 出版日期: August 31, 2026
- Edition 版本: 1st
- Language 语言: English
- Print length 页数: 300 pages
- ISBN-10: 8770224196
- ISBN-13: 9788770224192
Book Description
It starts with an introductory overview of the effects of radiation in space and harsh environments with a specific focus on analog circuits to enable the reader to understand why specific design solutions are adopted to mitigate hard/soft errors. The following four chapters are devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components applied to Operational Amplifiers, Voltage References, Analog-to-Digital (ADC) and Digital-to-Analog (DAC) converters. Each chapter is organized with a first part which recalls the basic working principles of such circuit and a second part which describes the main RHBD techniques proposed in the literature to make them resilient to radiation. The approach follows a top-down scheme starting from RHBD at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and finishing at layout level (how to shape a layout to mitigate radiation effects).
The sixth chapter is devoted to a special class of analog circuit, the dosimeters, which are gaining importance in space, health and nuclear applications. By leveraging the characteristic of a Flash-memory cell, a re-usable dosimeter is described which includes the sensitive element itself, the analog interface and the process of characterization.
The last chapter is an overview of the strategies adopted for the testing of analog and mixed-signal circuits. In particular, it will focus also on the measurement campaigns performed by the authors aiming for the characterization of developed rad-hard components under total dose (TID) and single-events (SEE).
Technical topics discussed in the book include:
- Radiation effects on semiconductor components (TID, SEE)
- Radiation Hardening by Design (RHBD) Techniques
- Rad-hard Operational Amplifiers
- Rad-hard Voltage References
- Rad-hard ADC
- Rad-hard DAC
- Rad-hard Special Circuits
- Testing Strategies
Editorial Reviews
Editorial Reviews
About the Author
Dr. Umberto Gattiwas born in Pavia (Italy) in 1962. He received Laurea and Ph.D. degrees in electronics engineering from the University of Pavia in 1987 and 1992, respectively. From 1993 to 1999, he worked in the R&D Lab of Italtel, as ASIC Designer, and was involved in modeling analog ICs. In 1999, he joined the Development Technologies Lab of Siemens, where he was Sr. Design ASIC Engineer. Besides developing telecom ICs, he was the coordinator of Eureka-Medea+ projects focused on high-speed sigma-delta converters. In 2008 he moved to Nokia Siemens Networks where he worked as Sr. Power Supply Architect. Since 2012 he has been with RedCat Devices as a member of the executive staff. During his career he has been involved in the design of data-converters, broadband wireless transceivers, Hall sensors micro-systems and power supply architectures. His current research interests are in rad-hard CMOS ICs, particularly rad-hard libraries and memories (SRAMs and OTP), rad-hard mixed-signal circuits (ADC-DAC), rad-hard linear voltage regulators, and in testing such components. He holds 2 international patents and is co-author of about 60 papers and one book. He is Senior Member of IEEE and serves also as reviewer for magazines and conferences.
Cristiano Calligaroreceived his laurea degree in electronics engineering and his Ph.D. degree in electronics and information technology engineering from the University of Pavia (Italy) in 1992 and 1997 respectively. In 2006 he established RedCat Devices srl as a start-up. During his career he has been involved in memory design (volatile and non-volatile) both for consumer application (multilevel flash memories) and space applications (rad-hard memories) and software design for SEE/TID evaluation using open source EDA tools. His current research interest is focused on rad-hard standard cell libraries to be used for rad-hard mixed signal ASICs, stand-alone memory compilers and testing methodologies for rad-hard components. He holds more than 20 patents mainly in the field of multilevel NVMs and he is co-author of more than 60 papers and one book (Rad-hard Semiconductor Memories, River Publishers). He has been coordinator of RAMSES and ATENA projects inside the Italy–Israel Cooperation Programme, SkyFlash project in the European FP7 Programme, EuroSRAM4Space project in the Eureka Eurostars Programme and RADPROM project funded by Italian Space Agency (ASI). He is an IEEE Senior Member and an IEEE Transactions on Nuclear Science reviewer.
