IoT System Testing: An IoT Journey from Devices to Analytics and the Edge 1st ed. Edition
by Jon Duncan Hagar(Author)
Publisher finelybook 出版社: Apress; 1st ed. edition (September 17, 2022)
Language 语言: English
Print Length 页数: 345 pages
ISBN-10: 1484282752
ISBN-13: 9781484282755
Book Description
To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion―of IoT―from a quality testing viewpoint. You’ll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you’ll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. What You Will Learn
Understand IoT software test architecture and planning
Master IoT security testing and test techniques
Study IoT test lab automation and architectures
Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V
Who This Book Is ForReaders with basic knowledge of software development who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book.
